Chang-Liao, Kuei-Shu (張廖貴術)
Email : email@example.com
Phone : +886-03-5715131 ext.42674
Office : ESSBuilding, R312
國立清華大學 工程與系統科學系教授199908 ~
國立清華大學 工程與系統科學系兼任副系主任200808 ~ 200912
國立清華大學 原科中心儀器組組長200208 ~ 200507
美國耶魯大學 電機工程系訪問研究員200005 ~ 200008
國立清華大學 工程與系統科學系副教授199208 ~ 199907
Kuei-Shu Chang-Liao received the B.S. and M.S. degrees in Telecommunication and Electronics from National Chiao Tung University , 1984 and 1989, respectively, and the Ph.D. degree in Electrical Engineering from National Taiwan University in 1992.
In 1992, he joined the faculty at the National Tsing Hua University where he has been a Professor of Department of Engineering and System Science since 1999. In 2000, he was a visiting research fellow at the Department of Electrical Engineering of Yale University, where he was involved in Flash memory and charge pumping measurement. His current research interests include high-k gate dielectric process, plasma charging effects, radiation effects and applications on semiconductor devices, profiling interface trap/charge in MOS device by charge pumping analysis, and Flash memory operation. Dr. Chang-Liao is a senior member of IEEE and a member of the Electrochemical Society and American Vacuum Society.