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Semiconductor Device Processing & Measuring Lab
National Tsing Hua University, Department of Engineering and System Science
Project 2017
低溫製程成長介電層與通道於三維電荷捕捉式快閃記憶體元件之研究(2/3)
2017/08/01~2018/07/31
Study of gate stack, contact resistance reduction, channel structures and materials for N7 FinFETs
2017/03/01~2018/02/28
核能電廠低中壓電纜老化檢測與評估研究
2017/01/01~2017/12/31
頂尖中心計畫-下世代三維電荷捕捉式快閃記憶體元件製程研究106(奈微米科技互動研究中心)
2017/01/01~2017/12/31
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